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タイトル: Bare PCB inspection system with SV-GMR sensor eddy-current testing probe
著者: Chomsuwan, K.
Yamada, Sotoshi link image
Iwahara, Masayoshi link image
山田, 外史
岩原, 正吉
発行日: 2007年 5月
出版社(者): IEEE
雑誌名: IEEE Sensors Journal
巻: 7
号: 5
開始ページ: 890
終了ページ: 895
キーワード: Eddy-current testing (ECT)
Harmonic analysis
Printed circuit board (PCB)
Spin-valve giant magnetoresistance (SV-GMR)
抄録: This paper describes bare printed circuit board (PCB) inspection based on eddy-current testing (ECT) technique with high scanning speed. A high-frequency ECT probe composed of a meander coil as an exciting coil and the spin-valve giant magnetoresistance (SV-GMR) sensor was fabricated and is proposed. The ECT probe was designed based on crack inspection over flat surface, especially suitable for microdefect detection on high-density bare PCB. The ECT signal detected by the SV-GMR sensor was acquired by high-speed A/D converter for applying the signal processing based on digital technique. Harmonic analysis based on Fourier transform was used to analyze the ECT signal at fundamental frequency in order to increase inspection speed and this technique allowed the ECT probe to scan bare PCB, with high sampling frequency and with high-spatial resolution inspection. Experimental results verified the possibility and the performance of the proposed PCB inspection system based on ECT technique. © 2007 IEEE.
DOI: 10.1109/JSEN.2007.894145
URI: http://hdl.handle.net/2297/6914
関連URI: http://dx.doi.org/10.1109/JSEN.2007.894145
資料種別: Journal Article
権利関係: © IEEE 2007
版表示: publisher
出現コレクション:1. 査読済論文

このアイテムを引用あるいはリンクする場合は次の識別子を使用してください。 http://hdl.handle.net/2297/6914



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